Materials characterization technique development
I have an abiding interest in the development of new electron microscopy and electron, x-ray, and neutron diffraction techniques.
I have developed techniques for electron backscatter diffraction (EBSD) that allow for mapping of plastic deformation at micro-length scales. Much of this work is summarized in Chapter 18 of Electron Backscatter Diffraction in Materials Science. I have also worked on the application of multivariate statistical analysis techniques to microanalysis data-x-rays, electron diffraction, and mass spectroscopy. In 2008, I published an article examining the application of MVSA techniques to EBSD data.
We are also doing quite a bit of work on the use of x-rays and neutrons for measuring residual stresses in crystalline materials. Much of this work is applied to other areas of my research-welding, additive manufacturing, and peening.
I have developed techniques for electron backscatter diffraction (EBSD) that allow for mapping of plastic deformation at micro-length scales. Much of this work is summarized in Chapter 18 of Electron Backscatter Diffraction in Materials Science. I have also worked on the application of multivariate statistical analysis techniques to microanalysis data-x-rays, electron diffraction, and mass spectroscopy. In 2008, I published an article examining the application of MVSA techniques to EBSD data.
We are also doing quite a bit of work on the use of x-rays and neutrons for measuring residual stresses in crystalline materials. Much of this work is applied to other areas of my research-welding, additive manufacturing, and peening.
